The quality control can be done by six test commands in the MIDAS CCDTEST context. The commands are called TESTX/CCD where X can be: B for the bias, D for dark, F for flat, T for transfer, S for shutter, and C for charge transfer efficiency. All output ( i.e. ASCII and MIDAS tables, postscript files of graphics and display output) will be put in the users working directory. In addition, the MIDAS logfile will contain a complete log of the results. A description of the commands and the output produced follows below.