TESTBA/CCD |
in_cat [out_id] [meth] [rows] [colums] [area]
[fil_siz] [dec_fac] |
|
do a series of tests on a catalogue of bias frames |
TESTC/CCD |
in_frm [rows] x_pix [colums] y_pix |
|
compute horizontal and vertical charge transfer efficiency |
TESTD/CCD |
in_cat [out_id] [dec_fac] |
|
do a test on a catalogue of dark current frames |
TESTFA/CCD |
in_cat [out_id] [meth] [area] [exp_ran] [theshold] |
|
do a series of tests on a catalogue of low count flat frames |
TESTS/CCD |
in_frm1 in_frm2 [out_frm] n_exp [dec_fac] |
|
find the shutter error distribution |
TESTTA/CCD |
in_cat [out_id] [area] [select] |
|
do linearity and transfer tests on a catalogue of flat frames |