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The command does a series of tests on a catalogue of low count flat
frames and produces:
- A combined low count flat frame corrected for the bias offset;
- An ASCII and MIDAS table containing traps and other defects
in the stacked master flat frame that show values less than
N times the median counts in the frame. Only pixels
within the input area are considered and repetitions of cold
pixels in the increasing y coordinate are not listed.
The combined low count flat field is corrected for the mean bias
offset, stored in the keyword BIASMEAN, filled by the command
TESTB/CCD. The user can also supply this keyword with the
name of the combined bias frame, also produced by TESTB/CCD.
In that case this frame will be used for the bias correction.
Pascal Ballester
Tue Mar 28 16:52:29 MET DST 1995